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Special Graduate Schools
Graduate School of Science and Technology
Department of Information and Electronics Engineering
3. Theses(Master)
SIP/MCP를 고려한 최적화된 바운드리 스캔 방법에 대한 고찰
- Alternative Title
- CHAE, EUN SEOK
- Author(s)
- 채은석
- Alternative Author(s)
- CHAE, EUN SEOK
- Advisor
- 이자성
- Department
- 산업대학원 정보전자공학과
- Publisher
- The Graduate School, Ajou University
- Publication Year
- 2008-02
- Language
- kor
- Keyword
- JTAG; Boundary Scan; SIP; MCP
- Abstract
- 바운드리 스캔은 IEEE Std. 1149.1으로도 명명된 매우 잘 알려진 DFT (Design For Testability) 기술 이다. 이는 입출력과 내부 로직 사이에 바운드리 스캔 레지스터를 할당함으로써 구현된다. 본 논문에서는 이러한 바운드리 스캔 기술이 SIP (Silicon In Package)나 MCP (Multi Chip Package) 상에 구현할 때의 문제점을 도출하고, 이를 해결할 수 있는 최적화된 해결책을 제시한다. 본 논문에서 제시하는 방법은 1) 가장 작은 Area Overhead, 2) 최단 시간의 테스트 시간, 3) 가장 간단한 디자인 방법을 포함한다.
- Alternative Abstract
- Boundary Scan is well-known standard DFT techniques, called IEEE Std. 1149.1, that is designed with boundary scan register placed between pads and internal logic. In this paper, I deduce those problems of the implementation in SIP (Silicon In Package) or MCP (Multi-Chip Package) and I propose the optimal solution against those problems. The advantage of the proposed solution includes: (1) it realizes the smallest area overhead. (2) it minimizes the test cost, and (3) this solution is easy to implement.
- Fulltext
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- Special Graduate Schools > Graduate School of Science and Technology > Department of Information and Electronics Engineering > 3. Theses(Master)
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