Fine Pattern용 검사를 위한 AOI Auto Focus Control에 관한 연구

Alternative Title
KIM HWANJAE
Author(s)
김환재
Alternative Author(s)
KIM HWANJAE
Advisor
김영길
Department
산업대학원 정보전자공학과
Publisher
The Graduate School, Ajou University
Publication Year
2009-02
Language
kor
Keyword
PCB
URI
https://dspace.ajou.ac.kr/handle/2018.oak/6831
Fulltext

Appears in Collections:
Special Graduate Schools > Graduate School of Science and Technology > Department of Information and Electronics Engineering > 3. Theses(Master)
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