영상처리를 이용한 반도체 마이크로볼 격자열 패키지의 납볼 결함 검사 알고리즘 개발에 관한 연구

Author(s)
박종욱
Advisor
최태영
Department
일반대학원 전자공학과
Publisher
The Graduate School, Ajou University
Publication Year
2001
Language
kor
URI
https://dspace.ajou.ac.kr/handle/2018.oak/14637
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Graduate School of Ajou University > Department of Electronic Engineering > 3. Theses(Master)
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